By W. Neumann, M. Pasemann, J. Heydenreich (auth.), Prof. Dr. H. C. Freyhardt (eds.)
In strong kingdom physics and in fabrics technological know-how the research of the relationship among the houses of solids and their microstructure is of significant value. For crystalline fabrics this connection is said to the lattice constitution, and it may be proven convinc ingly that the cloth houses rely on deviations from the fitting lattice constitution within the majority of instances. hence a competent detection and research of defects in "nearly ideal" crystals is critical, and a adequate spatial solution of the equipment utilized is needed. simply because electrons at the one hand strongly engage with the problem to be investigated and nevertheless can simply be centred electron-optical tools are very effective for this objective. they're utilized in the diffraction mode, within the imaging mode and within the spectroscopic mode. The possible excessive lateral answer within the imaging mode makes the applying of electron microscopy specifically powerful. even supposing already worthy details on crystal defects should be received through the use of the regimen means of diffraction distinction imagingl-3) which has a solution of a few four 10 nm - within the exact weak-beam procedure ) of a few nm -, the detection of crystal defects and inhomogeneities, resp. on an atomic or molecular point via the help of excessive answer electron microscopy will get expanding importance.
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Electron Microsc. : Optik 42, 1 (1975) Misell, D. : J. Phys. (London) D 9, 1249 (1976) Grinton, G. , Cowley, J. : Optik 34, 221 (1971) 43 W. Neumann et al. 40. 41. 42. 43. 44. 45. 46. 47. 48. 49. 50. 51. 52. 53. 54. 55. 56. 57. 58. 59. 60. 61. 62. 63. 64. 65. 66. 67. 68. 69. 70. 71. 72. 73. 74. 75. 76. 77. 78. 79. 80. : J. Appl. Phys. : Optik 39, 39 (1973) Wade, R. : Optik 49, 81 (1977) Wade, R. : Ultramicroscopy 3, 329 (1978) Humphreys, C. , Spence, J. C. , Siegel, B. : Appl. Phys. Lett. 8, 258 (1966) Hashimoto, H.
Lattice fringe image of the 1]-phase in an Al-Mg-Zn alloy 2nm ~ 33 W. Neumann et al. 202 nm) . In the matrix-precipitation interface every fifth matrix fringe terminates and exactly at that place a dark slightly bended band starts and runs over the precipitation to the opposite interface where the same feature can be observed. Measurements of the distance of the dark broad bands show that no moire contrast is present. From such experiments conclusions concerning the misfit parameter are possible l 28).
Electr. , Toronto 1978, Vol. III, p. 195 154. , Toronto 1978, Vol. III, p. 130 155. : Proc. 7th Europ. Reg. Congr. Electr. , The Hague 1980, Vol. I, p. 380 127. 128. 129. 130. 131. 132. 133. 134. 135. 136. 137. 138. 139. 140. 141. 142. 143. 144. 145. 146. 147. 148. 149. 150. 151. 152. 46 In-situ UHV Electron Microscopy of Surfaces Katsumichi Vagi, Kunio Takayanagi and Goro Honjo Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro-ku, Tokyo, 152 Japan This article reviews recent sUrface studies performed with an electron microscope with conventional optics.